feat: Flash-HAL-Interface und Settings-Store mit A/B-Slots

Implementiert: - Flash HAL (nl_flash_read/write/erase_sector) Interfaces - Flash Layout mit A/B-Settings Slots und weiteren Regions - Test-Fake für Flash mit Fehlerinjection (Stromausfall-Simulation) - Settings-Store mit CRC32 Recovery und Slot-Alternierung - Vollständige Test-Suite mit Corruption/Power-Loss-Tests
2026-09-11 13:24:52 +02:00
parent e0bde7bee3
commit 91721ac47d
8 changed files with 360 additions and 0 deletions
@@ -0,0 +1,105 @@
+#include <string.h>
+#include "unity.h"
+#include "fake_flash.h"
+#include "config/nl_flash_layout.h"
+#include "config/nl_settings.h"
+#include "light/nl_light_types.h"
+
+void setUp(void)
+{
+    fake_flash_reset();
+    nl_settings_init(NL_FL_SETTINGS_A, NL_FL_SETTINGS_B);
+}
+
+void tearDown(void)
+{
+    TEST_ASSERT_EQUAL_UINT(0, fake_flash_dirty_writes);
+}
+
+static nl_settings_t sample(const char *name)
+{
+    nl_settings_t s;
+    nl_settings_defaults(&s);
+    strcpy(s.wifi_ssid, "ninHome");
+    strcpy(s.wifi_pass, "secret");
+    strcpy(s.name, name);
+    s.auth_all = 1;
+    s.power_on_behaviour = NL_POB_ON;
+    s.fade_in_ms = 1200;
+    return s;
+}
+
+static void test_defaults(void)
+{
+    nl_settings_t s;
+    TEST_ASSERT_FALSE(nl_settings_load(&s));
+    TEST_ASSERT_EQUAL_STRING("", s.wifi_ssid);
+    TEST_ASSERT_EQUAL_STRING("aabbccddeeff0011223344", s.token);
+    TEST_ASSERT_EQUAL_STRING("", s.name);
+    TEST_ASSERT_EQUAL_UINT8(0, s.auth_all);
+    TEST_ASSERT_EQUAL_UINT8(NL_POB_LAST, s.power_on_behaviour);
+    TEST_ASSERT_EQUAL_UINT16(500, s.fade_in_ms);
+    TEST_ASSERT_EQUAL_UINT16(500, s.fade_out_ms);
+}
+
+static void test_save_and_load(void)
+{
+    nl_settings_t in = sample("Wohnzimmer"), out;
+    TEST_ASSERT_EQUAL_INT(0, nl_settings_save(&in));
+    TEST_ASSERT_TRUE(nl_settings_load(&out));
+    TEST_ASSERT_EQUAL_MEMORY(&in, &out, sizeof in);
+}
+
+static void test_alternates_slots(void)
+{
+    nl_settings_t s, out;
+    s = sample("a"); nl_settings_save(&s);
+    s = sample("b"); nl_settings_save(&s);
+    s = sample("c"); nl_settings_save(&s);
+    TEST_ASSERT_EQUAL_UINT(2, fake_flash_erases[0]);
+    TEST_ASSERT_EQUAL_UINT(1, fake_flash_erases[1]);
+    TEST_ASSERT_TRUE(nl_settings_load(&out));
+    TEST_ASSERT_EQUAL_STRING("c", out.name);
+}
+
+static void test_power_loss_keeps_previous(void)
+{
+    nl_settings_t s = sample("old"), out;
+    nl_settings_save(&s);
+    s = sample("new");
+    fake_flash_fail_after(50);
+    TEST_ASSERT_NOT_EQUAL(0, nl_settings_save(&s));
+    fake_flash_fail_after(-1);
+    TEST_ASSERT_TRUE(nl_settings_load(&out));
+    TEST_ASSERT_EQUAL_STRING("old", out.name);
+}
+
+static void test_corrupt_newest_falls_back(void)
+{
+    nl_settings_t s, out;
+    s = sample("first"); nl_settings_save(&s);   /* slot A */
+    s = sample("second"); nl_settings_save(&s);  /* slot B */
+    fake_flash_mem[NL_FL_SETTINGS_B + 40] ^= 0x01;
+    TEST_ASSERT_TRUE(nl_settings_load(&out));
+    TEST_ASSERT_EQUAL_STRING("first", out.name);
+}
+
+static void test_erase(void)
+{
+    nl_settings_t s = sample("x"), out;
+    nl_settings_save(&s);
+    TEST_ASSERT_EQUAL_INT(0, nl_settings_erase());
+    TEST_ASSERT_FALSE(nl_settings_load(&out));
+}
+
+int main(void)
+{
+    UNITY_BEGIN();
+    RUN_TEST(test_defaults);
+    RUN_TEST(test_save_and_load);
+    RUN_TEST(test_alternates_slots);
+    RUN_TEST(test_power_loss_keeps_previous);
+    RUN_TEST(test_corrupt_newest_falls_back);
+    RUN_TEST(test_erase);
+    return UNITY_END();
+}