Michael Sauer
91721ac47d
Implementiert: - Flash HAL (nl_flash_read/write/erase_sector) Interfaces - Flash Layout mit A/B-Settings Slots und weiteren Regions - Test-Fake für Flash mit Fehlerinjection (Stromausfall-Simulation) - Settings-Store mit CRC32 Recovery und Slot-Alternierung - Vollständige Test-Suite mit Corruption/Power-Loss-Tests
106 lines
2.9 KiB
C
106 lines
2.9 KiB
C
#include <string.h>
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#include "unity.h"
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#include "fake_flash.h"
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#include "config/nl_flash_layout.h"
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#include "config/nl_settings.h"
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#include "light/nl_light_types.h"
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void setUp(void)
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{
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fake_flash_reset();
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nl_settings_init(NL_FL_SETTINGS_A, NL_FL_SETTINGS_B);
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}
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void tearDown(void)
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{
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TEST_ASSERT_EQUAL_UINT(0, fake_flash_dirty_writes);
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}
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static nl_settings_t sample(const char *name)
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{
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nl_settings_t s;
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nl_settings_defaults(&s);
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strcpy(s.wifi_ssid, "ninHome");
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strcpy(s.wifi_pass, "secret");
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strcpy(s.name, name);
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s.auth_all = 1;
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s.power_on_behaviour = NL_POB_ON;
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s.fade_in_ms = 1200;
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return s;
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}
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static void test_defaults(void)
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{
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nl_settings_t s;
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TEST_ASSERT_FALSE(nl_settings_load(&s));
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TEST_ASSERT_EQUAL_STRING("", s.wifi_ssid);
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TEST_ASSERT_EQUAL_STRING("aabbccddeeff0011223344", s.token);
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TEST_ASSERT_EQUAL_STRING("", s.name);
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TEST_ASSERT_EQUAL_UINT8(0, s.auth_all);
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TEST_ASSERT_EQUAL_UINT8(NL_POB_LAST, s.power_on_behaviour);
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TEST_ASSERT_EQUAL_UINT16(500, s.fade_in_ms);
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TEST_ASSERT_EQUAL_UINT16(500, s.fade_out_ms);
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}
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static void test_save_and_load(void)
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{
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nl_settings_t in = sample("Wohnzimmer"), out;
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TEST_ASSERT_EQUAL_INT(0, nl_settings_save(&in));
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TEST_ASSERT_TRUE(nl_settings_load(&out));
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TEST_ASSERT_EQUAL_MEMORY(&in, &out, sizeof in);
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}
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static void test_alternates_slots(void)
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{
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nl_settings_t s, out;
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s = sample("a"); nl_settings_save(&s);
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s = sample("b"); nl_settings_save(&s);
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s = sample("c"); nl_settings_save(&s);
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TEST_ASSERT_EQUAL_UINT(2, fake_flash_erases[0]);
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TEST_ASSERT_EQUAL_UINT(1, fake_flash_erases[1]);
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TEST_ASSERT_TRUE(nl_settings_load(&out));
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TEST_ASSERT_EQUAL_STRING("c", out.name);
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}
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static void test_power_loss_keeps_previous(void)
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{
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nl_settings_t s = sample("old"), out;
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nl_settings_save(&s);
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s = sample("new");
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fake_flash_fail_after(50);
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TEST_ASSERT_NOT_EQUAL(0, nl_settings_save(&s));
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fake_flash_fail_after(-1);
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TEST_ASSERT_TRUE(nl_settings_load(&out));
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TEST_ASSERT_EQUAL_STRING("old", out.name);
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}
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static void test_corrupt_newest_falls_back(void)
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{
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nl_settings_t s, out;
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s = sample("first"); nl_settings_save(&s); /* slot A */
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s = sample("second"); nl_settings_save(&s); /* slot B */
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fake_flash_mem[NL_FL_SETTINGS_B + 40] ^= 0x01;
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TEST_ASSERT_TRUE(nl_settings_load(&out));
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TEST_ASSERT_EQUAL_STRING("first", out.name);
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}
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static void test_erase(void)
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{
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nl_settings_t s = sample("x"), out;
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nl_settings_save(&s);
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TEST_ASSERT_EQUAL_INT(0, nl_settings_erase());
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TEST_ASSERT_FALSE(nl_settings_load(&out));
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}
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int main(void)
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{
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UNITY_BEGIN();
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RUN_TEST(test_defaults);
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RUN_TEST(test_save_and_load);
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RUN_TEST(test_alternates_slots);
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RUN_TEST(test_power_loss_keeps_previous);
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RUN_TEST(test_corrupt_newest_falls_back);
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RUN_TEST(test_erase);
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return UNITY_END();
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}
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