Michael Sauer
91721ac47d
Implementiert: - Flash HAL (nl_flash_read/write/erase_sector) Interfaces - Flash Layout mit A/B-Settings Slots und weiteren Regions - Test-Fake für Flash mit Fehlerinjection (Stromausfall-Simulation) - Settings-Store mit CRC32 Recovery und Slot-Alternierung - Vollständige Test-Suite mit Corruption/Power-Loss-Tests
61 lines
1.5 KiB
C
61 lines
1.5 KiB
C
#include "fake_flash.h"
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#include <string.h>
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uint8_t fake_flash_mem[FAKE_FLASH_SIZE];
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unsigned fake_flash_erases[FAKE_FLASH_SECTORS];
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unsigned fake_flash_dirty_writes;
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static long s_fail_after = -1;
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void fake_flash_reset(void)
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{
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memset(fake_flash_mem, 0xFF, sizeof fake_flash_mem);
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memset(fake_flash_erases, 0, sizeof fake_flash_erases);
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fake_flash_dirty_writes = 0;
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s_fail_after = -1;
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}
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void fake_flash_fail_after(long bytes)
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{
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s_fail_after = bytes;
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}
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int nl_flash_read(uint32_t addr, void *buf, uint32_t len)
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{
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if (addr + len > FAKE_FLASH_SIZE)
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return -1;
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memcpy(buf, &fake_flash_mem[addr], len);
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return 0;
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}
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int nl_flash_write(uint32_t addr, const void *buf, uint32_t len)
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{
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const uint8_t *p = (const uint8_t *)buf;
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if (addr + len > FAKE_FLASH_SIZE)
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return -1;
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for (uint32_t i = 0; i < len; i++) {
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if (s_fail_after == 0)
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return -1;
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if (s_fail_after > 0)
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s_fail_after--;
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if (fake_flash_mem[addr + i] != 0xFF)
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fake_flash_dirty_writes++;
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fake_flash_mem[addr + i] &= p[i]; /* NOR: bits only go from 1 to 0 */
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}
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return 0;
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}
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int nl_flash_erase_sector(uint32_t addr)
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{
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if (addr % NL_FLASH_SECTOR_SIZE || addr >= FAKE_FLASH_SIZE || s_fail_after == 0)
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return -1;
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memset(&fake_flash_mem[addr], 0xFF, NL_FLASH_SECTOR_SIZE);
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fake_flash_erases[addr / NL_FLASH_SECTOR_SIZE]++;
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return 0;
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}
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uint32_t nl_flash_region_base(void)
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{
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return 0;
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}
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